Share Email Print

Proceedings Paper

UV seeding of IR laser induced damage
Author(s): N. C. Kerr
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The values of the laser induced surface damage thresholds for samples of silicon, fused quartz and soda lime glass at both 0.248pm (UV) and 10.6pm (IR) are presented. Experiments are then described where laser damage is induced using crossed UV-IR beams, with varying time delays imposed between the arrivals of the two laser pulses at the sample surface. The results of these crossed beam experiments are then discussed. Order of magnitude reductions in the IR damage thresholds of silicon and glass are observed when the beams are crossed, no such reduction is observed for quartz. Further, only in the case of glass samples is a reduction in the UV damage threshold seen when the beams are crossed. The reduction in IR threshold on silicon has been seen with delays between the laser pulses of up to 100ns. The reduction in IR threshold for glass was seen for delays up to 1.2ms. These results lead to a discussion of the role of so-called seed electrons in the damage process and the mechanisms operative at the different wavelengths.

Paper Details

Date Published: 1 November 1990
PDF: 10 pages
Proc. SPIE 1438, Laser-Induced Damage in Optical Materials 1989, 14381F (1 November 1990); doi: 10.1117/12.2294460
Show Author Affiliations
N. C. Kerr, Loughborough Univ. of Technology (United Kingdom)

Published in SPIE Proceedings Vol. 1438:
Laser-Induced Damage in Optical Materials 1989
Harold E. Bennett; Lloyd L. Chase; Arthur H. Guenther; Brian Emerson Newnam; M. J. Soileau, Editor(s)

© SPIE. Terms of Use
Back to Top