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Proceedings Paper

Surface analytical methods for the assessment of damage in optical thin films
Author(s): James R. Hoenigman
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Paper Abstract

With the recent advances in surface analytical instrumentation, a methodology now exists which enables optical thin films to be studied in considerable detail. Scanning Auger spectroscopy with argon ion etching capabilities in conjunction with scanning electron microscopy, backscatter electron microscopy, optical microscopy, and light element energy dispersive x-ray spectroscopy have been successfully used at the University of Dayton to study coating defects and radiation induced damage in a variety of specimens. A brief description of the capabilities and limitations of some of these techniques will be given. Ball cratering, a relatively obscure technique by which underlying layers in an optical stack can be exposed, has proven to be a power- ful tool which has extended the range of the above mentioned analytical techniques. Some examples of adhesion failures, crack phenomena, substrate and film failures, and Auger depth profiling will be presented.

Paper Details

Date Published: 1 November 1990
PDF: 10 pages
Proc. SPIE 1438, Laser-Induced Damage in Optical Materials 1989, 14380Z (1 November 1990); doi: 10.1117/12.2294444
Show Author Affiliations
James R. Hoenigman, Univ. of Dayton Research Institute (United States)


Published in SPIE Proceedings Vol. 1438:
Laser-Induced Damage in Optical Materials 1989
Harold E. Bennett; Lloyd L. Chase; Arthur H. Guenther; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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