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Proceedings Paper

The effect of subsurface defects on "incipient" (below threshold) laser damage nucleation in fused silica optical flats
Author(s): T. J. Magee
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Paper Abstract

The development of subsurface defects in optical components has been extensively investigated by the authors and others over the past few years. Investigation of optical components using nondestructive photon backscattering (PBSTM), delineation etch/ optical microscopy and charge decoration/delineation techniques has shown laterally variable spatial distributions of subsurface defects in the form of lineated remnant polishing traces, voids, and microscopic impurity clusters introduced during the surface finishing process. In this paper, we report on the correlation between nondestructive PBSTM mapping and delineation etch/optical microscopy techniques for detection of subsurface defects, as well as the effect of subsurface defects qn the initiation of microscopic or "incipient" laser damage (A= 248 nm) at levels below the point of macroscopic or catastrophic failure observed at the surface. The detection of laser induced microscopic cracking on nucleation sites within nondestructively identified areas provides additional insight into the progressive develop- ment of failure sites in distributed subsurface regions of low RMS, optically finished surfaces.

Paper Details

Date Published: 1 November 1990
PDF: 9 pages
Proc. SPIE 1438, Laser-Induced Damage in Optical Materials 1989, 14380M (1 November 1990); doi: 10.1117/12.2294431
Show Author Affiliations
T. J. Magee, XMR Inc. (United States)

Published in SPIE Proceedings Vol. 1438:
Laser-Induced Damage in Optical Materials 1989
Harold E. Bennett; Lloyd L. Chase; Arthur H. Guenther; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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