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Proceedings Paper

Application of the Ronchi ruling beam profiling method to axially symmetric laser beams
Author(s): Robert M. O'Connell
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Paper Abstract

The application of the Ronchi ruling beam characterization method to axially symmetric optical beams is analyzed. Specific results are derived for the Airy and focused annulus diffraction patterns. Plots of the ratio of minimum to maximum transmitted optical power versus the first null radius of the beam functions show that for the Airy pattern and other focused annuli with obscuration ratios smaller than approximately 0.30, the method should be just as useful as with Gaussian beams.

Paper Details

Date Published: 1 November 1990
PDF: 13 pages
Proc. SPIE 1438, Laser-Induced Damage in Optical Materials 1989, 14380I (1 November 1990); doi: 10.1117/12.2294427
Show Author Affiliations
Robert M. O'Connell, Univ. of Missouri-Columbia (United States)

Published in SPIE Proceedings Vol. 1438:
Laser-Induced Damage in Optical Materials 1989
Harold E. Bennett; Lloyd L. Chase; Arthur H. Guenther; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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