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Proceedings Paper

Sensitive n2 measurements using a single beam
Author(s): M. Sheik-Bahae
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Paper Abstract

We present a sensitive single beam technique for measuring nonlinear refraction in a variety of materials that offers simplicity, sensitivity and speed. The transmittance of a sample is measured through a finite aperture in the far-field as the sample is moved along the propagation path (z) of a focused Gaussian beam. The sign and magnitude of the nonlinearity is easily deduced from such a transmittance curve (Z-scan). Employing this technique a sensitivity of better than A/300 wavefront distortion is achieved in n2 measurements of BaF2 using picosecond visible laser pulses.

Paper Details

Date Published: 1 November 1990
PDF: 10 pages
Proc. SPIE 1438, Laser-Induced Damage in Optical Materials 1989, 14380D (1 November 1990); doi: 10.1117/12.2294422
Show Author Affiliations
M. Sheik-Bahae, CREOL, Univ. of Central Florida (United States)


Published in SPIE Proceedings Vol. 1438:
Laser-Induced Damage in Optical Materials 1989
Harold E. Bennett; Lloyd L. Chase; Arthur H. Guenther; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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