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Proceedings Paper

A triangulation based profiler
Author(s): T. A. Clarke
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Paper Abstract

This paper reports a triangulation based measuring system which has applicability to the increasing demand for close range measurement data. This system uses a linear sensor array and diode laser light source and is discussed with respect to theory, calibration and practical results. An analysis of the use of this profiler to acquire spatial information (e.g. wriggle surveys, refurbishment) and local information (e.g. deformation) is given. Consideration is given to: errors from setting up, establishing a datum, profile position, and the inherent errors particular to triangulation systems.

Paper Details

Date Published: 1 August 1990
PDF: 8 pages
Proc. SPIE 1395, Close-Range Photogrammetry Meets Machine Vision, 13953D (1 August 1990); doi: 10.1117/12.2294364
Show Author Affiliations
T. A. Clarke, City Univ. London (United Kingdom)


Published in SPIE Proceedings Vol. 1395:
Close-Range Photogrammetry Meets Machine Vision
Armin Gruen; Emmanuel P. Baltsavias, Editor(s)

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