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Proceedings Paper

A survey and examination of subpixel measurement techniques
Author(s): G. A. W. West; T. A. Clarke
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Paper Abstract

There is increasing use of electronic sensors and digital signal processing for measurements of optically acquired data. Applications include automatic inspection, surveying, remote sensing and photogrammetry. Sensors, at the present time, require subpixel methods to improve the resolution above that available given the spacing of sensing elements and the analogue to digital conversion resolution. This paper reviews proposed subpixel methods in the context of an increasingly important application, namely, the determination of the position of a laser spot on a sensing array for triangulation. A number of techniques are chosen and analysed experimentally. Their performances are compared and contrasted with respect to spatial resolution, quantisation accuracy and noise. For the comparison, use is made of simulated data, and real data obtained from a triangulation system9.

Paper Details

Date Published: 1 August 1990
PDF: 8 pages
Proc. SPIE 1395, Close-Range Photogrammetry Meets Machine Vision, 13951M (1 August 1990); doi: 10.1117/12.2294301
Show Author Affiliations
G. A. W. West, City Univ. (United Kingdom)
T. A. Clarke, City Univ. (United Kingdom)


Published in SPIE Proceedings Vol. 1395:
Close-Range Photogrammetry Meets Machine Vision
Armin Gruen; Emmanuel P. Baltsavias, Editor(s)

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