Share Email Print

Proceedings Paper

Monitoring the fabrication process for as-built analysis and generation
Author(s): Sankar Jayaram; Yvan J. Beliveau; Richard W. Conners
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The objective of this paper is to present a theoretical model which will create a computer vision system capable of monitoring the fabrication of a facil- ity. The monitoring process would be able to identify out-of-position components and to re-create an as-built CAD model from the construction process. An as-built schedule would be a direct output and would provide for improved scheduling inter action and analysis. While computer vision .technology has not reached maturity where arbitrarily complex scenes can be processed and "understood", there h reason to believe that a vision system for monitoring the fabrication of a facility can be developed. To create such a vision system will require a number of tasks. The focus of this project is to use the information in the CAD system together with the camera model, the camera location, the orientation of the opti- cal axis and the positions of the illuminators to predict how the objects in the facility should appear. This information can then be used in "top-down" analysis of the scene. In a top-down analysis a scene model is used to guide the search for the objects in the scene. While developing sophisticated computer vision systems has, in general, been difficult, developing sophisticated top-down vision systems has not.

Paper Details

Date Published: 1 August 1990
PDF: 7 pages
Proc. SPIE 1395, Close-Range Photogrammetry Meets Machine Vision, 13951A (1 August 1990); doi: 10.1117/12.2294289
Show Author Affiliations
Sankar Jayaram, Virginia Polytechnic Institute and State Univ. (United States)
Yvan J. Beliveau, Virginia Polytechnic Institute and State Univ. (United States)
Richard W. Conners, Virginia Polytechnic Institute and State Univ. (United States)

Published in SPIE Proceedings Vol. 1395:
Close-Range Photogrammetry Meets Machine Vision
Armin Gruen; Emmanuel P. Baltsavias, Editor(s)

© SPIE. Terms of Use
Back to Top