Share Email Print

Proceedings Paper

Multi-class segmentation of neuronal electron microscopy images using deep learning
Author(s): Nivedita Khobragade; Chirag Agarwal
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Study of connectivity of neural circuits is an essential step towards a better understanding of functioning of the nervous system. With the recent improvement in imaging techniques, high-resolution and high-volume images are being generated requiring automated segmentation techniques. We present a pixel-wise classification method based on Bayesian SegNet architecture. We carried out multi-class segmentation on serial section Transmission Electron Microscopy (ssTEM) images of Drosophila third instar larva ventral nerve cord, labeling the four classes of neuron membranes, neuron intracellular space, mitochondria and glia / extracellular space. Bayesian SegNet was trained using 256 ssTEM images of 256 x 256 pixels and tested on 64 different ssTEM images of the same size, from the same serial stack. Due to high class imbalance, we used a class-balanced version of Bayesian SegNet by re-weighting each class based on their relative frequency. We achieved an overall accuracy of 93% and a mean class accuracy of 88% for pixel-wise segmentation using this encoder-decoder approach. On evaluating the segmentation results using similarity metrics like SSIM and Dice Coefficient, we obtained scores of 0.994 and 0.886 respectively. Additionally, we used the network trained using the 256 ssTEM images of Drosophila third instar larva for multi-class labeling of ISBI 2012 challenge ssTEM dataset.

Paper Details

Date Published: 2 March 2018
PDF: 6 pages
Proc. SPIE 10574, Medical Imaging 2018: Image Processing, 105742W (2 March 2018); doi: 10.1117/12.2293940
Show Author Affiliations
Nivedita Khobragade, Univ. of Illinois at Chicago (United States)
Chirag Agarwal, Univ. of Illinois at Chicago (United States)

Published in SPIE Proceedings Vol. 10574:
Medical Imaging 2018: Image Processing
Elsa D. Angelini; Bennett A. Landman, Editor(s)

© SPIE. Terms of Use
Back to Top