Share Email Print
cover

Proceedings Paper

An efficient hole-filling method based on depth map in 3D view generation
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

New virtual view is synthesized through depth image based rendering(DIBR) using a single color image and its associated depth map in 3D view generation. Holes are unavoidably generated in the 2D to 3D conversion process. We propose a hole-filling method based on depth map to address the problem. Firstly, we improve the process of DIBR by proposing a one-to-four (OTF) algorithm. The “z-buffer” algorithm is used to solve overlap problem. Then, based on the classical patch-based algorithm of Criminisi et al., we propose a hole-filling algorithm using the information of depth map to handle the image after DIBR. In order to improve the accuracy of the virtual image, inpainting starts from the background side. In the calculation of the priority, in addition to the confidence term and the data term, we add the depth term. In the search for the most similar patch in the source region, we define the depth similarity to improve the accuracy of searching. Experimental results show that the proposed method can effectively improve the quality of the 3D virtual view subjectively and objectively.

Paper Details

Date Published: 12 January 2018
PDF: 9 pages
Proc. SPIE 10620, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology, 1062018 (12 January 2018); doi: 10.1117/12.2293301
Show Author Affiliations
Haitao Liang, Tianjin Univ. (China)
Xiu Su, Tianjin Univ. (China)
Yilin Liu, Tianjin Univ. (China)
Huaiyuan Xu, Tianjin Univ. (China)
Yi Wang, Tianjin Univ. (China)
Xiaodong Chen, Tianjin Univ. (China)


Published in SPIE Proceedings Vol. 10620:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology
Guohai Situ; Xun Cao; Wolfgang Osten; Liquan Dong, Editor(s)

© SPIE. Terms of Use
Back to Top