Share Email Print
cover

Proceedings Paper • new

Accurate measuring temperature by infrared thermal imaging system in vacuum and cryogenic environment
Author(s): Yonghong Shang; Dongxing Tao; Yaqing Hou; Jing Wang; Yifei Pei
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Infrared thermal imaging technology uses the detector to receive infrared radiation from the measured object, and the object temperature distribution will be changed into a visual image by signal processing system. The accuracy of measuring temperature will be affected by the surface emission rate, reflectivity, atmospheric attenuation, and background radiation and environmental effect under normal temperature and pressure conditions. In order to realize the accurate temperature measurement under the condition of ultra-high vacuum and cryogenic environment, the general formula of the theoretic temperature of measured object surface is deduced, which based on the principle of thermal radiation and temperature measurement by infrared thermal imager. In this paper, the impact factors of temperature measurement accuracy of long-wave infrared thermal imaging system under those conditions are analyzed, and various theoretical numerical value of factors are plotted on the curve of precious accuracy temperature measurement. The results of analysis for the thermal imaging system will improve temperature measurement precision in vacuum thermal test, which have active practical significance.

Paper Details

Date Published: 12 January 2018
PDF: 6 pages
Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 106210L (12 January 2018); doi: 10.1117/12.2293247
Show Author Affiliations
Yonghong Shang, Beijing Institute of Spacecraft Environment Engineering (China)
Dongxing Tao, Beijing Institute of Spacecraft Environment Engineering (China)
Yaqing Hou, Beijing Institute of Spacecraft Environment Engineering (China)
Jing Wang, Beijing Institute of Spacecraft Environment Engineering (China)
Yifei Pei, Beijing Institute of Spacecraft Environment Engineering (China)


Published in SPIE Proceedings Vol. 10621:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Liquan Dong, Editor(s)

© SPIE. Terms of Use
Back to Top