Share Email Print
cover

Proceedings Paper

Sinogram synthesis using convolutional-neural-network for sparsely view-sampled CT
Author(s): Jongha Lee; Hoyeon Lee; Seungryong Cho
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Reducing the number of projections in computed tomography (CT) has been exploited as a low-dose option in conjunction with advanced iterative image reconstruction algorithms. While such iterative image reconstruction methods do provide useful images and valuable insights of the inverse imaging problems, it is an intriguing issue whether missing view projection data in the sinogram can be successfully recovered. There have been reported several approaches to interpolating the missing sinogram data. Deep-learning based super-resolution techniques in the field of natural image enhancement have been recently introduced and showed promising results. Inspired by the super-resolution techniques, we have earlier proposed a sinogram inpainting method that uses a convolutional-neural-network for sparsely viewsampled CT. Despite of the encouraging initial results, our previously proposed method had two drawbacks. The measured sinogram was contaminated in the process of filling the missing sinogram by the deep learning network. Additionally, the sum of the interpolated sinogram in the direction of detector row at each view angle was not preserved. In this study, we improve our previously developed deep-learning based sinogram synthesis method by adding new layers and modifying the size of receptive field in the deep learning network to overcome the above limitations. From the quantitative evaluations on the image accuracy and quality using real patients’ CT images, we show that the new approach synthesizes more accurate sinogram and thus leads to higher quality of CT image than the previous one.

Paper Details

Date Published: 2 March 2018
PDF: 10 pages
Proc. SPIE 10574, Medical Imaging 2018: Image Processing, 105742A (2 March 2018); doi: 10.1117/12.2293244
Show Author Affiliations
Jongha Lee, Korea Advanced Institute of Science and Technology (Korea, Republic of)
Samsung Electronics (Korea, Republic of)
Hoyeon Lee, Korea Advanced Institute of Science and Technology (Korea, Republic of)
Seungryong Cho, Korea Advanced Institute of Science and Technology (Korea, Republic of)


Published in SPIE Proceedings Vol. 10574:
Medical Imaging 2018: Image Processing
Elsa D. Angelini; Bennett A. Landman, Editor(s)

© SPIE. Terms of Use
Back to Top