Share Email Print

Proceedings Paper • new

Count statistics and pileup correction for nonparalyzable photon counting detectors with finite pulse length
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Photon counting detectors are expected to be the next big step in the development of medical computed tomography. Accurate modeling of the behavior of photon counting detectors in the high count rate regime is therefore important for detector performance evaluations and the development of accurate image reconstruction methods. The commonly used ideal nonparalyzable detector model is based on the assumption that photon interactions are converted to pulses with zero extent in time, which is too simplistic to accurately predict the behavior of photon counting detectors in both low and high count rate regimes. In this work we develop a statistical count model for a nonparalyzable detector with finite pulse length and use it to derive the asymptotic mean and variance of the output count distribution using tools from renewal theory. We use the statistical moments of the distribution to construct an estimator of the true number of counts for pileup correction. We confirm the accuracy of the model and evaluate the pileup correction using Monte Carlo simulations. The results show that image quality is preserved for surprisingly high count rates.

Paper Details

Date Published: 9 March 2018
PDF: 10 pages
Proc. SPIE 10573, Medical Imaging 2018: Physics of Medical Imaging, 105730Z (9 March 2018); doi: 10.1117/12.2293095
Show Author Affiliations
Fredrik Grönberg, KTH Royal Institute of Technology (Sweden)
Martin Sjölin, KTH Royal Institute of Technology (Sweden)
Mats Danielsson, KTH Royal Institute of Technology (Sweden)

Published in SPIE Proceedings Vol. 10573:
Medical Imaging 2018: Physics of Medical Imaging
Joseph Y. Lo; Taly Gilat Schmidt; Guang-Hong Chen, Editor(s)

© SPIE. Terms of Use
Back to Top