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Proceedings Paper

Reliability testing of ultra-low noise InGaAs quad photoreceivers
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Paper Abstract

We have developed ultra-low noise quadrant InGaAs photoreceivers for multiple applications ranging from Laser Interferometric Gravitional Wave Detection, to 3D Wind Profiling. Devices with diameters of 0.5 mm, 1mm, and 2 mm were processed, with the nominal capacitance of a single quadrant of a 1 mm quad photodiode being 2.5 pF. The 1 mm diameter InGaAs quad photoreceivers, using a low-noise, bipolar-input OpAmp circuitry exhibit an equivalent input noise per quadrant of <1.7 pA/√Hz in 2 to 20 MHz frequency range. The InGaAs Quad Photoreceivers have undergone the following reliability tests: 30 MeV Proton Radiation up to a Total Ionizing Dose (TID) of 50 krad, Mechanical Shock, and Sinusoidal Vibration.

Paper Details

Date Published: 23 February 2018
PDF: 10 pages
Proc. SPIE 10526, Physics and Simulation of Optoelectronic Devices XXVI, 105261J (23 February 2018); doi: 10.1117/12.2293010
Show Author Affiliations
Abhay M. Joshi, Discovery Semiconductors, Inc. (United States)
Shubhashish Datta, Discovery Semiconductors, Inc. (United States)
Narasimha Prasad, NASA Langley Research Ctr. (United States)
Michael Sivertz, NASA Space Radiation Lab., Brookhaven National Lab. (United States)

Published in SPIE Proceedings Vol. 10526:
Physics and Simulation of Optoelectronic Devices XXVI
Bernd Witzigmann; Marek Osiński; Yasuhiko Arakawa, Editor(s)

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