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Proceedings Paper

High resolution particle tracking method by suppressing the wavefront aberrations
Author(s): Xinyu Chang; Yuan Yang; Li Kou; Lei Jin; Junsheng Lu; Xiaodong Hu
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Paper Abstract

Digital in-line holographic microscopy is one of the most efficient methods for particle tracking as it can precisely measure the axial position of particles. However, imaging systems are often limited by detector noise, image distortions and human operator misjudgment making the particles hard to locate. A general method is used to solve this problem. The normalized holograms of particles were reconstructed to the pupil plane and then fit to a linear superposition of the Zernike polynomial functions to suppress the aberrations. Relative experiments were implemented to validate the method and the results show that nanometer scale resolution was achieved even when the holograms were poorly recorded.

Paper Details

Date Published: 12 January 2018
PDF: 6 pages
Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 1062119 (12 January 2018); doi: 10.1117/12.2292973
Show Author Affiliations
Xinyu Chang, Tianjin Univ. (China)
Yuan Yang, Tianjin Univ. (China)
Li Kou, Tianjin Univ. (China)
Lei Jin, Tianjin Univ. (China)
Junsheng Lu, Tianjin Univ. (China)
Xiaodong Hu, Tianjin Univ. (China)


Published in SPIE Proceedings Vol. 10621:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Liquan Dong, Editor(s)

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