Share Email Print

Proceedings Paper

Microscale localization and isolation of light emitting imperfections in monocrystalline silicon solar cells
Author(s): Adam Gajdoš; Lubomír Škvarenina; Pavel Škarvada; Robert Macků
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

An imperfections or defects may appear in fabricated monocrystalline solar cells. These microstructural imperfections could have impact on the parameters of whole solar cell. The research is divided into two parts, firstly, the detection and localization defects by using several techniques including current-voltage measurement, scanning probe microscopy (SPM), scanning electron microscope (SEM) and electroluminescence. Secondly, the defects isolation by a focused ion beam (FIB) milling and impact of a milling process on solar cells. The defect detection is realized by I-V measurement under reverse biased sample. For purpose of localization, advantage of the fact that defects or imperfections in silicon solar cells emit the visible and near infrared electroluminescence under reverse biased voltage is taken, and CCD camera measurement for macroscopic localization of these spots is applied. After rough macroscopic localization, microscopic localization by scanning probe microscopy combined with a photomultiplier (shadow mapping) is performed. Defect isolation is performed by a SEM equipped with the FIB instrument. FIB uses a beam of gallium ions which modifies crystal structure of a material and may affect parameters of solar cell. As a result, it is interesting that current in reverse biased sample with isolated defect is smaller approximately by 2 orders than current before isolation process.

Paper Details

Date Published: 1 December 2017
PDF: 6 pages
Proc. SPIE 10603, Photonics, Devices, and Systems VII, 1060316 (1 December 2017); doi: 10.1117/12.2292711
Show Author Affiliations
Adam Gajdoš, Brno Univ. of Technology (Czech Republic)
Lubomír Škvarenina, Brno Univ. of Technology (Czech Republic)
Pavel Škarvada, Brno Univ. of Technology (Czech Republic)
Robert Macků, Brno Univ. of Technology (Czech Republic)

Published in SPIE Proceedings Vol. 10603:
Photonics, Devices, and Systems VII
Karel Fliegel; Petr Páta, Editor(s)

© SPIE. Terms of Use
Back to Top