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Proceedings Paper

Standards on the permanence of recording materials
Author(s): Peter Z. Adelstein
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Paper Abstract

The permanence of recording materials is dependent upon many factors, and these differ for photographic materials, magnetic tape and optical disks. Photographic permanence is affected by the (1) stability of the material, (2) the photographic processing and (3) the storage conditions. American National Standards on the material and the processing have been published for different types of film and standard test methods have been established for color film. The third feature of photographic permanence is the storage requirements and these have been established for photographic film, prints and plates.

Standardization on the permanence of electronic recording materials is more complicated. As with photographic materials, stability is dependent upon (1) the material itself and (2) the storage environment. In addition, retention of the necessary (3) hardware and (4) software is also a prerequisite. American National Standards activity in these areas has been underway for the past six years. A test method for the material which determines the life expectancy of CD-ROMs has been standardized. The problems of determining the expected life of magnetic tape have been more formidable but the critical physical properties have been determined. A specification for the storage environment of magnetic tape has been finalized and one on the storage of optical disks is being worked on. Critical but unsolved problems are the obsolescence of both the hardware and the software necessary to read digital images.

Paper Details

Date Published: 1 February 1996
PDF: 21 pages
Proc. SPIE 10283, Standards for Electronics Imaging Technologies, Devices, and Systems: A Critical Review, 1028309 (1 February 1996); doi: 10.1117/12.229260
Show Author Affiliations
Peter Z. Adelstein, Image Permanence Institute (United States)


Published in SPIE Proceedings Vol. 10283:
Standards for Electronics Imaging Technologies, Devices, and Systems: A Critical Review
Michael C. Nier, Editor(s)

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