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Proceedings Paper

Dielectric and metal target identification based on polarized light scattering analysis: a numerical study
Author(s): Zhen-Gang Yan; Weiping Sun; Meng Ren; Hongpeng Lv; Jie Li; Liang Xue; Keding Yan; Shouyu Wang
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Paper Abstract

In order to quantitatively analyze scattering from two dimensional randomly rough Gaussian surfaces, Kirchhoff approximation method is adopted in numerical calculation for analyzing full angular Stokes vectors of light scattering. With studying both the p- and s-polarized scattering fields from various materials such as metals and dielectrics, it is found that V components of scattering light from metals and dielectrics are different. Via analytical calculation according to slope probability density, the V component difference is attributed to refractive index of materials. Both numerical and analytical calculations prove the V component difference in light scattering can act as a criterion for metal and dielectric identification.

Paper Details

Date Published: 12 January 2018
PDF: 12 pages
Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 1062117 (12 January 2018); doi: 10.1117/12.2292521
Show Author Affiliations
Zhen-Gang Yan, Xi'an Modern Control Technology Research Institute (China)
Weiping Sun, Xi'an Modern Control Technology Research Institute (China)
Meng Ren, Xi'an Modern Control Technology Research Institute (China)
Hongpeng Lv, Xi'an Modern Control Technology Research Institute (China)
Jie Li, Xi'an Modern Control Technology Research Institute (China)
Liang Xue, Shanghai Univ. of Electric Power (China)
Keding Yan, Xi'an Technological Univ. (China)
Shouyu Wang, Jiangnan Univ. (China)


Published in SPIE Proceedings Vol. 10621:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Liquan Dong, Editor(s)

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