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Proceedings Paper

Surface-enhanced Raman spectroscopy for remote sensing
Author(s): Tuan Vo-Dinh; David L. Stokes; Gordon H. Miller; Job M. Bello; Eric A. Wachter; John W. Haas; David R. James
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Paper Abstract

Conventional Raman spectroscopy is often limited by its low sensitivity due to the inherently weak Raman cross section of organic chemicals. A relatively new detection technique, Surface-Enhanced Raman Scattering (SERS) spectroscopy is based on recent experimental observations, which have indicated enhancement of the Raman scattering efficiency by factors of up to 106 when a compound is adsorbed on rough metallic surfaces that have submicron-scale protrusions. In this report we discuss the development of the SERS technique as a tool for monitoring hazardous chemical emissions and its application to in situ remote sensing.

Paper Details

Date Published: 1 November 1990
PDF: 8 pages
Proc. SPIE 1336, Raman and Luminescence Spectroscopies in Technology II, (1 November 1990); doi: 10.1117/12.22921
Show Author Affiliations
Tuan Vo-Dinh, Oak Ridge National Lab. (United States)
David L. Stokes, Oak Ridge National Lab. (United States)
Gordon H. Miller, Oak Ridge National Lab. (United States)
Job M. Bello, Oak Ridge National Lab. (United States)
Eric A. Wachter, Oak Ridge National Lab. (United States)
John W. Haas, Oak Ridge National Lab. (United States)
David R. James, Oak Ridge National Lab. (United States)


Published in SPIE Proceedings Vol. 1336:
Raman and Luminescence Spectroscopies in Technology II
Fran Adar; James E. Griffiths, Editor(s)

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