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Attenuation measurements in single-crystal sapphire fiber via Raman scattering intensity
Author(s): B. Liu; M. Buric; B. Chorpening; A. Wang; Z. Yu; D. Homa; Y. Cheng; C. Hill; G. Pickrell
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Paper Abstract

Performing attenuation measurements in unclad single crystal sapphire fiber has traditionally been accomplished through use the cutback method. Because single-crystal sapphire fibers do not cleave easily like silica fibers, this method requires repeated cutting and polishing of the sapphire fiber sample; which is very time consuming and introduces uncertainty in each loss measurement. In this paper, we present a new method to measure attenuation in sapphire or other single-crystal fibers based on distributed sapphire Raman optical time domain reflectometry (OTDR). This method is both nondestructive, significantly faster than the cutback method, and capable of measuring the local loss along the entire length of the fiber.

Paper Details

Date Published: 22 February 2018
PDF: 8 pages
Proc. SPIE 10528, Optical Components and Materials XV, 105280U (22 February 2018); doi: 10.1117/12.2291907
Show Author Affiliations
B. Liu, U.S. Dept. of Energy (United States)
West Virginia Univ. Research Cooperation (United States)
M. Buric, U.S. Dept. of Energy (United States)
B. Chorpening, U.S. Dept. of Energy (United States)
A. Wang, Virginia Polytechnic Institute and State Univ. (United States)
Z. Yu, Virginia Polytechnic Institute and State Univ. (United States)
D. Homa, Virginia Polytechnic Institute and State Univ. (United States)
Y. Cheng, Virginia Polytechnic Institute and State Univ. (United States)
C. Hill, Virginia Polytechnic Institute and State Univ. (United States)
G. Pickrell, Virginia Polytechnic Institute and State Univ. (United States)


Published in SPIE Proceedings Vol. 10528:
Optical Components and Materials XV
Shibin Jiang; Michel J. F. Digonnet, Editor(s)

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