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Proceedings Paper

Attenuation measurements in single-crystal sapphire fiber via Raman scattering intensity
Author(s): Bo Liu; Michael P. Buric; Zhihao Yu; Daniel Homa; Cary Hill; Yujie Cheng; Benjamin T. Chorpening; Gary Pickrell; Anbo Wang
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Paper Details

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Proc. SPIE 10528, Optical Components and Materials XV, ; doi: 10.1117/12.2291907
Show Author Affiliations
Bo Liu, National Energy Technology Lab. (United States)
Michael P. Buric, National Energy Technology Lab. (United States)
Zhihao Yu, Virginia Tech Ctr. for Photonics Technology (United States)
Daniel Homa, Virginia Tech Ctr. for Photonics Technology (United States)
Cary Hill, Virginia Polytechnic Institute and State Univ. (United States)
Yujie Cheng, Virginia Polytechnic Institute and State Univ. (United States)
Benjamin T. Chorpening, National Energy Technology Lab. (United States)
Gary Pickrell, Virginia Polytechnic Institute and State Univ. (United States)
Anbo Wang, Virginia Polytechnic Institute and State Univ. (United States)


Published in SPIE Proceedings Vol. 10528:
Optical Components and Materials XV
Shibin Jiang; Michel J. F. Digonnet, Editor(s)

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