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Proceedings Paper

Advances in surface-enhanced Raman spectroscopy for hazardous waste monitoring
Author(s): Eric A. Wachter; John W. Haas; David R. James; Richard B. Gammage; Trinidad L. Ferrell; Tuan Vo-Dinh
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Paper Abstract

Surface-enhanced Raman spectroscopy is being evaluated for use as an advanced method for detecting organic contaminants in groundwater during field-screening of environmental samples. The SERS technique offers attractive and unique capabilities for detecting a wide range of organic contaminants in aqueous environments at ppm to ppb levels. An inexpensive computer-controlled portable spectrometer system coupled to a fiberoptic probe has been developed for rapid on-site and in situ determination of organic contamination in groundwater. Applications of recent advances in substrate fabrication for use with environmental samples are discussed, and critical issues pertaining to substrate durability, repeatability, sensitivity, selectivity and universality are addressed.

Paper Details

Date Published: 1 November 1990
PDF: 7 pages
Proc. SPIE 1336, Raman and Luminescence Spectroscopies in Technology II, (1 November 1990); doi: 10.1117/12.22916
Show Author Affiliations
Eric A. Wachter, Oak Ridge National Lab. (United States)
John W. Haas, Oak Ridge National Lab. (United States)
David R. James, Oak Ridge National Lab. (United States)
Richard B. Gammage, Oak Ridge National Lab. (United States)
Trinidad L. Ferrell, Oak Ridge National Lab. (United States)
Tuan Vo-Dinh, Oak Ridge National Lab. (United States)


Published in SPIE Proceedings Vol. 1336:
Raman and Luminescence Spectroscopies in Technology II
Fran Adar; James E. Griffiths, Editor(s)

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