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Proceedings Paper

Goos-Hänchen effect on Si thin films with spherical and cylindrical pores
Author(s): Cherrie May Olaya; Wilson O. Garcia; Nathaniel Hermosa
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Paper Abstract

We examine the effects on the spatial and angular Goos-Hanchen (GH) beam shifts of spherical and cylindrical pores in a thin film. In our calculations, a p-polarized light is incident on a 1-μm thick porous silicon (Si) thin film on a Si substrate. The beam shifts are within the measurement range of usual optical detectors. Our results show that a technique based on GH shift can be used to determine the porosity and pore structure of thin films at a given thickness.

Paper Details

Date Published: 23 February 2018
PDF: 7 pages
Proc. SPIE 10533, Oxide-based Materials and Devices IX, 105332O (23 February 2018); doi: 10.1117/12.2291484
Show Author Affiliations
Cherrie May Olaya, Univ. of the Philippines (Philippines)
Wilson O. Garcia, Univ. of the Philippines (Philippines)
Nathaniel Hermosa, Univ. of the Philippines (Philippines)


Published in SPIE Proceedings Vol. 10533:
Oxide-based Materials and Devices IX
David J. Rogers; David C. Look; Ferechteh H. Teherani, Editor(s)

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