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Curved sensors for compact high-resolution wide-field designs: prototype demonstration and optical characterization
Author(s): Bertrand Chambion; Christophe Gaschet; Thibault Behaghel; Aurélie Vandeneynde; Stéphane Caplet; Stéphane Gétin; David Henry; Emmanuel Hugot; Wilfried Jahn; Simona Lombardo; Marc Ferrari
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Paper Abstract

Over the recent years, a huge interest has grown for curved electronics, particularly for opto-electronics systems. Curved sensors help the correction of off-axis aberrations, such as Petzval Field Curvature, astigmatism, and bring significant optical and size benefits for imaging systems. In this paper, we first describe advantages of curved sensor and associated packaging process applied on a 1/1.8’’ format 1.3Mpx global shutter CMOS sensor (Teledyne EV76C560) into its standard ceramic package with a spherical radius of curvature Rc=65mm and 55mm. The mechanical limits of the die are discussed (Finite Element Modelling and experimental), and electro-optical performances are investigated. Then, based on the monocentric optical architecture, we proposed a new design, compact and with a high resolution, developed specifically for a curved image sensor including optical optimization, tolerances, assembly and optical tests. Finally, a functional prototype is presented through a benchmark approach and compared to an existing standard optical system with same performances and a x2.5 reduction of length. The finality of this work was a functional prototype demonstration on the CEA-LETI during Photonics West 2018 conference. All these experiments and optical results demonstrate the feasibility and high performances of systems with curved sensors.

Paper Details

Date Published: 22 February 2018
PDF: 10 pages
Proc. SPIE 10539, Photonic Instrumentation Engineering V, 1053913 (22 February 2018); doi: 10.1117/12.2291472
Show Author Affiliations
Bertrand Chambion, Univ. Grenoble Alpes, CEA-LETI (France)
Christophe Gaschet, Univ. Grenoble Alpes, CEA-LETI (France)
Aix Marseille Univ., CNRS, LAM (France)
Thibault Behaghel, Aix Marseille Univ., CNRS, LAM (France)
Aurélie Vandeneynde, Univ. Grenoble Alpes, CEA-LETI (France)
Stéphane Caplet, Univ. Grenoble Alpes, CEA-LETI (France)
Stéphane Gétin, Univ. Grenoble Alpes, CEA-LETI (France)
David Henry, Univ. Grenoble Alpes, CEA-LETI (France)
Emmanuel Hugot, Aix Marseille Univ., CNRS, LAM (France)
Wilfried Jahn, Aix Marseille Univ., CNRS, LAM (France)
Simona Lombardo, Aix Marseille Univ., CNRS, LAM (France)
Marc Ferrari, Aix Marseille Univ., CNRS, LAM (France)


Published in SPIE Proceedings Vol. 10539:
Photonic Instrumentation Engineering V
Yakov G. Soskind, Editor(s)

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