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Proceedings Paper

Evaluation of the use of wavefront encoding to reduce depth-induced aberration in structured illumination microscopy
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Paper Abstract

Three-dimensional imaging is affected by depth-induced spherical aberration (SA) when imaging deep into an optically thick sample. In this work, we evaluate the impact of SA on the performance of incoherent grating-projection structured illumination microscopy (SIM). In particular, we analyze the reduction of the contrast in the structured pattern and compare the reconstructed SIM images for different amounts of SA. In order to mitigate the impact of SA, we implement and evaluate in SIM a wavefront encoded imaging system using a square cubic (SQUBIC) phase mask, an approach shown previously to be successful in conventional microscopy.

Paper Details

Date Published: 23 February 2018
PDF: 8 pages
Proc. SPIE 10499, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXV, 104991A (23 February 2018); doi: 10.1117/12.2291090
Show Author Affiliations
Nurmohammed Patwary, The Univ. of Memphis (United States)
Jorge Sola-Pikabea, Univ. de València (Spain)
Ana Doblas, The Univ. of Memphis (United States)
Genaro Saavedra, Univ. de València (Spain)
Manuel Martínez-Corral, Univ. de València (Spain)
Chrysanthe Preza, The Univ. of Memphis (United States)


Published in SPIE Proceedings Vol. 10499:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXV
Thomas G. Brown; Carol J. Cogswell; Tony Wilson, Editor(s)

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