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Design of an amplifier model accounting for thermal effect in fully aperiodic large pitch fibers
Author(s): K. Tragni; C. Molardi; F. Poli; R. Dauliat; B. Leconte; D. Darwich; R. du Jeu; M. A. Malleville; R. Jamier; S. Selleri; P. Roy; A. Cucinotta
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Paper Abstract

Yb-doped Photonic Crystal Fibers (PCFs) have triggered a significant power scaling into fiber-based lasers. However thermally-induced effects, like mode instability, can compromise the output beam quality. PCF design with improved Higher Order Mode (HOM) delocalization and effective thermal resilience can contain the problem. In particular, Fully- Aperiodic Large-Pitch Fibers (FA-LPFs) have shown interesting properties in terms of resilience to thermal effects. In this paper the performances of a Yb-doped FA-LPF amplifier are experimentally and numerically investigated. Modal properties and gain competition between Fundamental Mode (FM) and first HOM have been calculated, in presence of thermal effects. The main doped fiber characteristics have been derived by comparison between experimental and numerical results.

Paper Details

Date Published: 26 February 2018
PDF: 6 pages
Proc. SPIE 10512, Fiber Lasers XV: Technology and Systems, 1051228 (26 February 2018); doi: 10.1117/12.2290825
Show Author Affiliations
K. Tragni, Univ. degli Studi di Parma (Italy)
C. Molardi, Univ. degli Studi di Parma (Italy)
Nazarbayev Univ. (Kazakhstan)
F. Poli, Univ. degli Studi di Parma (Italy)
R. Dauliat, Univ. de Limoges, CNRS, XLIM (France)
B. Leconte, Univ. de Limoges, CNRS, XLIM (France)
D. Darwich, Univ. de Limoges, CNRS, XLIM (France)
R. du Jeu, Univ. de Limoges, CNRS, XLIM (France)
Thales Optronique SA (France)
M. A. Malleville, Univ. de Limoges, CNRS, XLIM (France)
Eolite Systems (France)
R. Jamier, Univ. de Limoges, CNRS, XLIM (France)
S. Selleri, Univ. degli Studi di Parma (Italy)
P. Roy, Univ. de Limoges, CNRS, XLIM (France)
A. Cucinotta, Univ. degli Studi di Parma (Italy)


Published in SPIE Proceedings Vol. 10512:
Fiber Lasers XV: Technology and Systems
Ingmar Hartl; Adrian L. Carter, Editor(s)

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