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Proceedings Paper

FDTD analysis of Aluminum/a-Si:H surface plasmon waveguides
Author(s): Paulo Lourenço; Alessandro Fantoni; Miguel Fernandes; Yuri Vygranenko; Manuela Vieira
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Paper Abstract

The large majority of surface plasmon resonance based devices use noble metals, namely gold or silver, in their manufacturing process. These metals present low resistivity, which leads to low optical losses in the visible and near infrared spectrum ranges. Gold shows high environmental stability, which is essential for long-term operation, and silver’s lower stability can be overcome through the deposition of an alumina layer, for instance. However, their high cost is a limiting factor if the intended target is large scale manufacturing.

In this work, it is considered a cost-effective approach through the selection of aluminum as the plasmonic material and hydrogenated amorphous silicon instead of its crystalline counterpart. This surface plasmon resonance device relies on Fano resonance to improve its response to refractive index deviations of the surrounding environment. Fano resonance is highly sensitive to slight changes of the medium, hence the reason we incorporated this interference phenomenon in the proposed device.

We report the results obtained when conducting Finite-Difference Time Domain algorithm based simulations on this metal-dielectric-metal structure when the active metal is aluminum, gold and silver. Then, we evaluate their sensitivity, detection accuracy and resolution, and the obtained results for our proposed device show good linearity and similar parameter performance as the ones obtained when using gold or silver as plasmonic materials.

Paper Details

Date Published: 23 February 2018
PDF: 7 pages
Proc. SPIE 10526, Physics and Simulation of Optoelectronic Devices XXVI, 105262D (23 February 2018); doi: 10.1117/12.2290721
Show Author Affiliations
Paulo Lourenço, Univ. Nova de Lisboa (Portugal)
Alessandro Fantoni, Instituto Superior de Engenharia de Lisboa (Portugal)
Univ. Nova de Lisboa (Portugal)
Miguel Fernandes, Instituto Superior de Engenharia de Lisboa (Portugal)
Univ. Nova de Lisboa (Portugal)
Yuri Vygranenko, Instituto Superior de Engenharia de Lisboa (Portugal)
Univ. Nova de Lisboa (Portugal)
Manuela Vieira, Instituto Superior de Engenharia de Lisboa (Portugal)
Univ. Nova de Lisboa (Portugal)


Published in SPIE Proceedings Vol. 10526:
Physics and Simulation of Optoelectronic Devices XXVI
Bernd Witzigmann; Marek Osiński; Yasuhiko Arakawa, Editor(s)

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