Share Email Print

Proceedings Paper

Multi-parameter estimation of high-Q silicon rich nitride resonators using optical frequency domain reflectometry
Author(s): Luis A. Bru; Zhichao Ye; Daniel Pastor; Pascual Muñoz
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Many linear and nonlinear optics applications rely on micro-resonators (MRRs) with carefully designed dispersion and coupling rate coefficients. These parameters are however challenging to measure for MRRs based on high-confinement optical waveguides. In this paper, we report on the use of optical frequency domain reflectometry (OFDR) for the measurement of group velocity dispersion (GVD), coupling coefficients and round-trip loss, in high-Q (Qi ∼ 0.3 × 106) silicon-rich nitride MRRs. This technique allows for retrieving the GVD coefficients, intrinsic losses and coupling coefficients for each transverse mode in the resonator, thus providing very valuable feed-back information from experiments to the design flow step.

Paper Details

Date Published: 23 February 2018
PDF: 8 pages
Proc. SPIE 10535, Integrated Optics: Devices, Materials, and Technologies XXII, 1053518 (23 February 2018); doi: 10.1117/12.2290641
Show Author Affiliations
Luis A. Bru, Univ. Politècnica de València (Spain)
Zhichao Ye, Chalmers Univ. of Technology (Sweden)
Daniel Pastor, Univ. Politècnica de València (Spain)
Pascual Muñoz, Univ. Politècnica de València (Spain)

Published in SPIE Proceedings Vol. 10535:
Integrated Optics: Devices, Materials, and Technologies XXII
Sonia M. García-Blanco; Pavel Cheben, Editor(s)

© SPIE. Terms of Use
Back to Top