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Uncertainty quantification and stochastic modelling of photonic device from experimental data through polynomial chaos expansion
Author(s): Abi Waqas; Daniele Melati; Zarlish Mushtaq; Andrea Melloni
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Paper Abstract

Unavoidable statistical variations in fabrication processes have a strong effect on the functionality of fabricated photonic circuits and on fabrication yield. It is hence essential to measure and consider these uncertainties during the design in order to predict the statistical behavior of the realized circuits. Also, during the mass production of photonic integrated circuits, the experimental evaluation of circuits’ desired quantity of interest in the presence of fabrication error can be crucial. In this paper we proposed the use of generalized polynomial chaos method to estimate the statistical properties of a circuit from a reduced number of experimental data whilst achieving good accuracy comparable to those obtained by Monte Carlo.

Paper Details

Date Published: 23 February 2018
PDF: 6 pages
Proc. SPIE 10535, Integrated Optics: Devices, Materials, and Technologies XXII, 105351A (23 February 2018); doi: 10.1117/12.2290540
Show Author Affiliations
Abi Waqas, Politecnico di Milano (Italy)
Mehran Univ. of Engineering and Technology (Pakistan)
Daniele Melati, National Research Council Canada (Canada)
Zarlish Mushtaq, Mehran Univ. of Engineering and Technology (Pakistan)
Andrea Melloni, Politecnico di Milano (Italy)


Published in SPIE Proceedings Vol. 10535:
Integrated Optics: Devices, Materials, and Technologies XXII
Sonia M. García-Blanco; Pavel Cheben, Editor(s)

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