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Proceedings Paper

Engineering the on-axis intensity of Bessel beam by a feedback tuning loop
Author(s): Runze Li; Xianghua Yu; Yanlong Yang; Tong Peng; Baoli Yao; Chunmin Zhang; Tong Ye
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Paper Abstract

The Bessel beam belongs to a typical class of non-diffractive optical fields that are characterized by their invariant focal profiles along the propagation direction. However, ideal Bessel beams only rigorously exist in theory; Bessel beams generated in the lab are quasi-Bessel beams with finite focal extensions and varying intensity profiles along the propagation axis. The ability to engineer the on-axis intensity profile to the desired shape is essential for many applications. Here we demonstrate an iterative optimization-based approach to engineering the on-axis intensity of Bessel beams. The genetic algorithm is used to demonstrate this approach. Starting with a traditional axicon phase mask, in the design process, the computed on-axis beam profile is fed into a feedback tuning loop of an iterative optimization process, which searches for an optimal radial phase distribution that can generate a generalized Bessel beam with the desired onaxis intensity profile. The experimental implementation involves a fine-tuning process that adjusts the originally targeted profile so that the optimization process can optimize the phase mask to yield an improved on-axis profile. Our proposed method has been demonstrated in engineering several zeroth-order Bessel beams with customized on-axis profiles. High accuracy and high energy throughput merit its use in many applications.

Paper Details

Date Published: 23 February 2018
PDF: 9 pages
Proc. SPIE 10499, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXV, 1049921 (23 February 2018); doi: 10.1117/12.2290358
Show Author Affiliations
Runze Li, Xi'an Institute of Optics and Precision Mechanics (China)
Xi'an Jiaotong Univ. (China)
Univ. of Chinese Academy of Sciences (China)
Xianghua Yu, Xi'an Institute of Optics and Precision Mechanics (China)
Yanlong Yang, Xi'an Institute of Optics and Precision Mechanics (China)
Tong Peng, Xi'an Institute of Optics and Precision Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Baoli Yao, Xi'an Institute of Optics and Precision Mechanics (China)
Chunmin Zhang, Xi'an Jiaotong Univ. (China)
Tong Ye, Clemson Univ. (United States)


Published in SPIE Proceedings Vol. 10499:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXV
Thomas G. Brown; Carol J. Cogswell; Tony Wilson, Editor(s)

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