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Subwavelength resolution Fourier ptychography with hemispherical digital condensers
Author(s): An Pan; Yan Zhang; Maosen Li; Meiling Zhou; Ming Lei; Baoli Yao
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Paper Abstract

Fourier ptychography (FP) is a promising computational imaging technique that overcomes the physical space-bandwidth product (SBP) limit of a conventional microscope by applying angular diversity illuminations. However, to date, the effective imaging numerical aperture (NA) achievable with a commercial LED board is still limited to the range of 0.3–0.7 with a 4×/0.1NA objective due to the constraint of planar geometry with weak illumination brightness and attenuated signal-to-noise ratio (SNR). Thus the highest achievable half-pitch resolution is usually constrained between 500–1000 nm, which cannot fulfill some needs of high-resolution biomedical imaging applications. Although it is possible to improve the resolution by using a higher magnification objective with larger NA instead of enlarging the illumination NA, the SBP is suppressed to some extent, making the FP technique less appealing, since the reduction of field-of-view (FOV) is much larger than the improvement of resolution in this FP platform. Herein, in this paper, we initially present a subwavelength resolution Fourier ptychography (SRFP) platform with a hemispherical digital condenser to provide high-angle programmable plane-wave illuminations of 0.95NA, attaining a 4×/0.1NA objective with the final effective imaging performance of 1.05NA at a half-pitch resolution of 244 nm with a wavelength of 465 nm across a wide FOV of 14.60 mm2 , corresponding to an SBP of 245 megapixels. Our work provides an essential step of FP towards high-NA imaging applications without scarfing the FOV, making it more practical and appealing.

Paper Details

Date Published: 23 February 2018
PDF: 8 pages
Proc. SPIE 10503, Quantitative Phase Imaging IV, 105032S (23 February 2018); doi: 10.1117/12.2289906
Show Author Affiliations
An Pan, Xi'an Institute of Optics and Precision Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Yan Zhang, Xi'an Institute of Optics and Precision Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Maosen Li, Xidian Univ. (China)
Meiling Zhou, Xi'an Institute of Optics and Precision Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Ming Lei, Xi'an Institute of Optics and Precision Mechanics (China)
Baoli Yao, Xi'an Institute of Optics and Precision Mechanics (China)


Published in SPIE Proceedings Vol. 10503:
Quantitative Phase Imaging IV
Gabriel Popescu; YongKeun Park, Editor(s)

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