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Proceedings Paper

Satellite-derived vertical profiles of temperature and dew point for mesoscale weather forecast
Author(s): Thomas Masselink; P. Schluessel
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Paper Abstract

Weather forecast-models need spatially high resolutioned vertical profiles of temperature and dewpoint for their initialisation. These profiles can be supplied by a combination of data from the Tiros-N Operational Vertical Sounder (TOVS) and the imaging Advanced Very High Resolution Radiometer (AVHRR) on board the NOAA polar orbiting sate!- lites. In cloudy cases the profiles derived from TOVS data only are of insufficient accuracy. The stanthrd deviations from radiosonde ascents or numerical weather analyses likely exceed 2 K in temperature and 5Kin dewpoint profiles. It will be shown that additional cloud information as retrieved from AVHIRR allows a significant improvement in theaccuracy of vertical profiles. The International TOVS Processing Package (ITPP) is coupled to an algorithm package called AVHRR Processing scheme Over cLouds, Land and Ocean (APOLLO) where parameters like cloud fraction and cloud-top temperature are determined with higher accuracy than obtained from TOVS retrieval alone. Furthermore, a split-window technique is applied to the cloud-free AVHRR imagery in order to derive more accurate surface temperatures than can be obtained from the pure TOVS retrieval. First results of the impact of AVHRR cloud detection on the quality of the profiles are presented. The temperature and humidity profiles of different retrieval approaches are validated against analyses of the European Centre for Medium-Range Weatherforecasts.

Paper Details

Date Published: 27 December 1995
PDF: 10 pages
Proc. SPIE 2578, Passive Infrared Remote Sensing of Clouds and the Atmosphere III, (27 December 1995); doi: 10.1117/12.228937
Show Author Affiliations
Thomas Masselink, DLR (Germany)
P. Schluessel, Univ. Hamburg (Germany)


Published in SPIE Proceedings Vol. 2578:
Passive Infrared Remote Sensing of Clouds and the Atmosphere III
David K. Lynch; Eric P. Shettle, Editor(s)

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