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A colinear backscattering Mueller matrix microscope for reflection Muller matrix imaging
Author(s): Zhenhua Chen; Yue Yao; Yuanhuan Zhu; Hui Ma
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Paper Abstract

In a recent attempt, we developed a colinear backscattering Mueller matrix microscope by adding polarization state generator (PSG) and polarization state analyzer (PSA) into the illumination and detection optical paths of a commercial metallurgical microscope. It is found that specific efforts have to be made to reduce the artifacts due to the intrinsic residual polarizations of the optical system, particularly the dichroism due to the 45 degrees beam splitter. In this paper, we present a new calibration method based on numerical reconstruction of the instrument matrix to remove the artifacts introduced by beam splitter. Preliminary tests using a mirror as a standard sample show that the maximum Muller matrix element error of the colinear backscattering Muller matrix microscope can be reduced to a few percent.

Paper Details

Date Published: 19 February 2018
PDF: 6 pages
Proc. SPIE 10489, Optical Biopsy XVI: Toward Real-Time Spectroscopic Imaging and Diagnosis, 104890M (19 February 2018); doi: 10.1117/12.2289291
Show Author Affiliations
Zhenhua Chen, Tsinghua-Berkeley Shenzhen Institute (China)
Yue Yao, Tsinghua-Berkeley Shenzhen Institute (China)
Yuanhuan Zhu, Tsinghua-Berkeley Shenzhen Institute (China)
Hui Ma, Tsinghua-Berkeley Shenzhen Institute (China)
Tsinghua Univ. (China)


Published in SPIE Proceedings Vol. 10489:
Optical Biopsy XVI: Toward Real-Time Spectroscopic Imaging and Diagnosis
Robert R. Alfano; Stavros G. Demos, Editor(s)

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