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Proceedings Paper

Extrinsic Fabry-Perot interferometer for ITS-related communication and sensing applications: an exact analysis
Author(s): Vivek Arya; Marten J. de Vries; Anbo Wang; Kent A. Murphy; Richard O. Claus
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Paper Abstract

The extrinsic Fabry-Perot interferometer has been implemented before for the health monitoring of multi-computer communication networks. Such integrated sensor and communication system architectures can be extremely useful during the implementation of ITS traffic management centers. The same optical fiber can be modified to provide the necessary communication link, and the incorporated sensor can be used to monitor the health of the computer network, for providing a fault-tolerant architecture. However the signal to noise ratio, minimum detection reliability, and dynamic range of the interferometer are of primary concern in such an implementation. The main objective of this paper is to present an exact analytical and experimental evaluation of the extrinsic Fabry-Perot interferometer using Kirchhoff's diffraction formalism. The obtained results are compared with the conventional two-beam interference model, and proved to correlate better with the experimental results. Future applications of this optical interferometer in other ITS applications are also discussed.

Paper Details

Date Published: 27 December 1995
PDF: 8 pages
Proc. SPIE 2592, Collision Avoidance and Automated Traffic Management Sensors, (27 December 1995); doi: 10.1117/12.228905
Show Author Affiliations
Vivek Arya, Virginia Polytechnic Institute and State Univ. (United States)
Marten J. de Vries, Virginia Polytechnic Institute and State Univ. (United States)
Anbo Wang, Virginia Polytechnic Institute and State Univ. (United States)
Kent A. Murphy, Virginia Polytechnic Institute and State Univ. (United States)
Richard O. Claus, Virginia Polytechnic Institute and State Univ. (United States)


Published in SPIE Proceedings Vol. 2592:
Collision Avoidance and Automated Traffic Management Sensors
Alan C. Chachich; Marten J. de Vries, Editor(s)

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