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A waveguide loss measurement method based on the reflected interferometric pattern of a Fabry-Perot cavity
Author(s): Yiming He; Zhaosong Li; Dan Lu
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Paper Abstract

We propose a new waveguide loss measurement method based on the reflected interferometric pattern from the waveguide. The loss of the waveguide is obtained by analyzing the fineness of the reflected interferometric pattern from the Fabry-Perot (F-P) cavity formed by the facets of a single-mode waveguide. In this method, a single mode lensed fiber and a circulator is used to direct the tunable laser into the waveguide under test and collect the reflected spectrum pattern through a photodetector. Comparing to the traditional transmission F-P interferometric method relying on double end fiber coupling, the proposed method requires only a single end coupling, considerably simplifying the coupling difficulty and the measurement system complexity. The fineness measurement is also free from the influence of background noise level, and reduces the coupling accuracy requirement. This method is low-cost, easy-to-operate and reliable, which can serve as an alternative method to measure the waveguide loss.

Paper Details

Date Published: 23 February 2018
PDF: 6 pages
Proc. SPIE 10535, Integrated Optics: Devices, Materials, and Technologies XXII, 105351U (23 February 2018); doi: 10.1117/12.2288922
Show Author Affiliations
Yiming He, Institute of Semiconductors (China)
Univ. of Chinese Academy of Sciences (China)
Beijing Key Lab. of Low Dimensional Semiconductor Materials and Devices (China)
Zhaosong Li, Institute of Semiconductors (China)
Univ. of Chinese Academy of Sciences (China)
Beijing Key Lab. of Low Dimensional Semiconductor Materials and Devices (China)
Dan Lu, Institute of Semiconductors (China)
Univ. of Chinese Academy of Sciences (China)
Beijing Key Lab. of Low Dimensional Semiconductor Materials and Devices (China)


Published in SPIE Proceedings Vol. 10535:
Integrated Optics: Devices, Materials, and Technologies XXII
Sonia M. García-Blanco; Pavel Cheben, Editor(s)

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