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Proceedings Paper

Scene-based Shack-Hartmann wavefront sensor for light-sheet microscopy
Author(s): Keelan Lawrence; Yang Liu; Savannah Dale; Rebecca Ball; Ariel J. VanLeuven; Andrew Sornborger; James D. Lauderdale; Peter Kner
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Paper Abstract

Light-sheet microscopy is an ideal imaging modality for long-term live imaging in model organisms. However, significant optical aberrations can be present when imaging into an organism that is hundreds of microns or greater in size. To measure and correct optical aberrations, an adaptive optics system must be incorporated into the microscope. Many biological samples lack point sources that can be used as guide stars with conventional Shack-Hartmann wavefront sensors. We have developed a scene-based Shack-Hartmann wavefront sensor for measuring the optical aberrations in a light-sheet microscopy system that does not require a point-source and can measure the aberrations for different parts of the image. The sensor has 280 lenslets inside the pupil, creates an image from each lenslet with a 500 micron field of view and a resolution of 8 microns, and has a resolution for the wavefront gradient of 75 milliradians per lenslet. We demonstrate the system on both fluorescent bead samples and zebrafish embryos.

Paper Details

Date Published: 23 February 2018
PDF: 6 pages
Proc. SPIE 10502, Adaptive Optics and Wavefront Control for Biological Systems IV, 105020B (23 February 2018); doi: 10.1117/12.2288777
Show Author Affiliations
Keelan Lawrence, The Univ. of Georgia (United States)
Yang Liu, The Univ. of Georgia (United States)
Savannah Dale, Clemson Univ. (United States)
Rebecca Ball, The Univ. of Georgia (United States)
Ariel J. VanLeuven, The Univ. of Georgia (United States)
Andrew Sornborger, Univ. of California, Davis (United States)
James D. Lauderdale, The Univ. of Georgia (United States)
Peter Kner, The Univ. of Georgia (United States)


Published in SPIE Proceedings Vol. 10502:
Adaptive Optics and Wavefront Control for Biological Systems IV
Thomas G. Bifano; Joel Kubby; Sylvain Gigan, Editor(s)

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