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Proceedings Paper

Surface plasmon holographic microscopy for near-field refractive index detection and thin film mapping
Author(s): Jianlin Zhao; Jiwei Zhang; Siqing Dai; Jianglei Di; Teli Xi
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Paper Abstract

Surface plasmon microscopy (SPM) is widely applied for label-free detection of changes of refractive index and concentration, as well as mapping thin films in near field. Traditionally, the SPM systems are based on the detection of light intensity or phase changes. Here, we present two kinds of surface plasmon holographic microscopy (SPHM) systems for amplitude- and phase-contrast imaging simultaneously. Through recording off-axis holograms and numerical reconstruction, the complex amplitude distributions of surface plasmon resonance (SPR) images can be obtained. According to the Fresnel’s formula, in a prism/ gold/ dielectric structure, the reflection phase shift is uniquely decided by refractive index of the dielectric. By measuring the phase shift difference of the reflected light exploiting prism-coupling SPHM system based on common-path interference configuration, monitoring tiny refractive index variation and imaging biological tissue are performed. Furthermore, to characterize the thin film thickness in near field, we employ a four-layer SPR model in which the third film layer is within the evanescent field. The complex reflection coefficient, including the reflectivity and reflection phase shift, is uniquely decided by the film thickness. By measuring the complex amplitude distributions of the SPR images exploiting objective-coupling SPHM system based on common-path interference configuration, the thickness distributions of thin films are mapped with sub-nanometer resolution theoretically. Owing to its high temporal stability, the recommended SPHMs show great potentials for monitoring tiny refractive index variations, imaging biological tissues and mapping thin films in near field with dynamic, nondestructive and full-field measurement capabilities in chemistry, biomedicine field, etc.

Paper Details

Date Published: 23 February 2018
PDF: 8 pages
Proc. SPIE 10503, Quantitative Phase Imaging IV, 1050316 (23 February 2018); doi: 10.1117/12.2288712
Show Author Affiliations
Jianlin Zhao, Northwestern Polytechnical Univ. (China)
Jiwei Zhang, Northwestern Polytechnical Univ. (China)
Siqing Dai, Northwestern Polytechnical Univ. (China)
Jianglei Di, Northwestern Polytechnical Univ. (China)
Teli Xi, Northwestern Polytechnical Univ. (China)


Published in SPIE Proceedings Vol. 10503:
Quantitative Phase Imaging IV
Gabriel Popescu; YongKeun Park, Editor(s)

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