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Proceedings Paper

Three-dimensional glue detection and evaluation based on linear structured light
Author(s): Zhitao Xiao; Ruipeng Yang; Lei Geng; Yanbei Liu
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Paper Abstract

During the online glue detection of body in white (BIW), the purpose of traditional glue detection based on machine vision is the localization and segmentation of glue, which is dissatisfactory for estimating the uniformity of glue with complex shape. A three-dimensional glue detection method based on the linear structured light and the movement parameters of robot is proposed. Firstly, the linear structured light and epipolar constraint algorithm are used for sign matching of binocular vision. Then, hand-eye relationship between robot and binocular camera is utilized to unified coordinate system. Finally, a structured light stripe extraction method is proposed to extract the sub-pixel coordinates of the light strip center. Experiments results demonstrate that the propose method can estimate the shape of glue accurately. For three kinds of glue with complex shape and uneven illumination, our method can detect the positions of blemishes. The absolute error of measurement is less than 1.04mm and the relative error is less than 10% respectively, which is suitable for online glue detection in BIW.

Paper Details

Date Published: 12 January 2018
PDF: 10 pages
Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 1062110 (12 January 2018); doi: 10.1117/12.2288653
Show Author Affiliations
Zhitao Xiao, Tianjin Key Lab. of Optoelectronic Detection Technology and Systems (China)
Tianjin Polytechnic Univ. (China)
Ruipeng Yang, Tianjin Key Lab. of Optoelectronic Detection Technology and Systems (China)
Tianjin Polytechnic Univ. (China)
Lei Geng, Tianjin Key Lab. of Optoelectronic Detection Technology and Systems (China)
Tianjin Polytechnic Univ. (China)
Yanbei Liu, Tianjin Key Lab. of Optoelectronic Detection Technology and Systems (China)
Tianjin Polytechnic Univ. (China)


Published in SPIE Proceedings Vol. 10621:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Liquan Dong, Editor(s)

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