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Proceedings Paper

All-polarization maintaining erbium fiber laser based on carbon nanowalls saturable absorber
Author(s): Shintaro Kurata; Jun Izawa; Norihito Kawaguchi
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Paper Abstract

We report a soliton mode locked femtosecond oscillation with all-polarization maintaining erbuim doped fiber laser based on Carbon Nanowalls saturable absorber (CNWs SA). To improve the stability and the capability of the oscillator, the all-polarization maintaining(all-PM) fiber is generally used since PM fiber is tolerant of stretches and bends. The saturable absorber is an optical device that placed in a laser cavity to suppress continuous wave operation to promote cooperation between many modes to sustain ultrashort pulse operation. We apply CNWs for the material of SAs in our oscillator. CNWs are one of the nanocarbon materials, which are a high-aspect-ratio structure in the cross-section, where, although their width and height range in a few micrometers, the thickness is as small as ten nanometers or so. A sheet of CNWs is made up of nano-size graphite grain aggregates. Then CNWs structure is expected to have a high absorption to the incident light and large modulation depth due to a small number of carbon layers as well as CNT and Graphene. With this all-PM fiber laser oscillator based on CNWs SA, the soliton mode-locked laser oscillated with 66.3MHz repetition frequency and its spectrum width is 5.6nm in FWHM. Average output power is 8.1mW with 122.5mW laser diode pump power. In addition, the laser amplification system with erbium-doped fiber is constructed and amplifies the femtosecond pulse laser into 268.2mW and 3000mW pumping power.

Paper Details

Date Published: 26 February 2018
PDF: 7 pages
Proc. SPIE 10512, Fiber Lasers XV: Technology and Systems, 105122U (26 February 2018); doi: 10.1117/12.2288100
Show Author Affiliations
Shintaro Kurata, IHI Corp. (Japan)
Jun Izawa, IHI Corp. (Japan)
Norihito Kawaguchi, IHI Corp. (Japan)

Published in SPIE Proceedings Vol. 10512:
Fiber Lasers XV: Technology and Systems
Ingmar Hartl; Adrian L. Carter, Editor(s)

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