Share Email Print
cover

Proceedings Paper

Initial research on the characterization methods of sparkle spots in optical thin films
Author(s): Jinhu Jiang; Wenhua Gu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In this article, we made a preliminary study on the main influencing factors of sparkle spots, put forward the concept of "sparklingness" to characterize the strength of sparkle spots, and proposed a standard measurement method for the sparklingness. We proposed to use 532 nm green laser pointer as the testing light source, let the light pass through the film and form a sparkle spots image at the receiving CCD or a piece of white paper. A standard image processing method was used to obtain an index number standing for the scattering status of the laser, which is defined as “sparklingness”. In the experiment, we also analyzed the power dependence of sparklingness. With proper calibration, the measurement error of the sparklingness can be minimized, and it can be used as a physical quantity to describe the film quality as of the sparkle issue. This work can be a useful reference for further study of the sparkle issue in optical films.

Paper Details

Date Published: 10 January 2018
PDF: 8 pages
Proc. SPIE 10616, 2017 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 1061609 (10 January 2018); doi: 10.1117/12.2288052
Show Author Affiliations
Jinhu Jiang, Nanjing Univ. of Science and Technology (China)
Wenhua Gu, Nanjing Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 10616:
2017 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Yongtian Wang; Baohua Jia; Kimio Tatsuno; Liquan Dong, Editor(s)

© SPIE. Terms of Use
Back to Top