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Proceedings Paper

chip defect detection based on deep convolution neural networks
Author(s): Shan Peng; Tiejun Yang
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Proc. SPIE OIT500, International Conference on Optical Instruments and Technology 2017: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology, ; doi: 10.1117/12.2287430
Show Author Affiliations
Shan Peng, Guilin Univ of Techn (China)
Tiejun Yang, Guilin Univ of Techn (China)


Published in SPIE Proceedings Vol. OIT500:
International Conference on Optical Instruments and Technology 2017: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology
Guohai Situ; Xun Cao; Wolfgang Osten; Liquan Dong, Editor(s)

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