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Proceedings Paper

Megahertz measurement rate wavemeter with sub-picometer resolution using second harmonic generation
Author(s): Mathias Christensen; Anders K. Hansen; Danny Noordegraaf; Peter M. W. Skovgaard; Ole B. Jensen
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Paper Abstract

Information on the wavelength is essential for most laser applications and a wide range of devices are available for measuring it. Commercially available wavemeters can provide femtometer resolution in a wide wavelength range but their refresh rate rarely goes into the kHz range. Streak cameras, on the other hand, provide extremely fast measurements with a wide spectrum. However, the spectral resolution is severely limited due to the use of a grating as the wavelength separating element. Here we present a wavemeter that combines a megahertz measurement rate and sub-picometer wavelength resolution. The technique uses the steep wavelength acceptance curve of a thick non-linear crystal to calculate the wavelength from just two power measurements. The bandwidth is limited only by the speed of a photodiode while the resolution and wavelength range can be engineered by choosing a suitable crystal type and geometry. We use the wavemeter to examine how the longitudinal mode evolves during a single pulse from a tapered diode laser. High resolution, high speed measurements of the wavelength can give new information about laser diodes, which is valuable for applications requiring short but wavelength stable pulses, such as pulsing of the second harmonic light.

Paper Details

Date Published: 15 February 2018
PDF: 7 pages
Proc. SPIE 10517, Real-time Measurements, Rogue Phenomena, and Single-Shot Applications III, 105170H (15 February 2018); doi: 10.1117/12.2287100
Show Author Affiliations
Mathias Christensen, Norlase ApS (Denmark)
Technical Univ. of Denmark (Denmark)
Anders K. Hansen, Technical Univ. of Denmark (Denmark)
Danny Noordegraaf, Norlase ApS (Denmark)
Peter M. W. Skovgaard, Norlase ApS (Denmark)
Ole B. Jensen, Technical Univ. of Denmark (Denmark)

Published in SPIE Proceedings Vol. 10517:
Real-time Measurements, Rogue Phenomena, and Single-Shot Applications III
Bahram Jalali; Daniel R. Solli; Günter Steinmeyer, Editor(s)

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