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Proceedings Paper

Analysis of Fourier ptychographic microscopy with half reduced images
Author(s): Ao Zhou; Ni Chen; Guohai Situ
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Paper Abstract

Fourier ptychography microscopy (FPM) provides gigapixel imaging with both a high image resolution and a wide field-of-view (FOV). However, it is time consuming during the image capture process. In this paper, we perform an analysis on the FPM imaging process. With numerical and experimental comparison, we find that the reconstructed high resolution images with half number of the total captured images is less degenerated compare to that using all the captured images, especially in the case that the object is amplitude or phase-only.

Paper Details

Date Published: 12 January 2018
PDF: 6 pages
Proc. SPIE 10620, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology, 1062011 (12 January 2018); doi: 10.1117/12.2287075
Show Author Affiliations
Ao Zhou, Shanghai Institute of Optics and Fine Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Ni Chen, Shanghai Institute of Optics and Fine Mechanics (China)
Guohai Situ, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 10620:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology
Guohai Situ; Xun Cao; Wolfgang Osten; Liquan Dong, Editor(s)

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