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Catastrophic optical bulk degradation in high-power single- and multi-mode InGaAs-AlGaAs strained QW lasers: part II
Author(s): Yongkun Sin; Talin Ayvazian; Miles Brodie; Zachary Lingley
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Paper Abstract

High-power single-mode (SM) and multi-mode (MM) InGaAs-AlGaAs strained quantum well (QW) lasers are critical components for both terrestrial and space satellite communications systems. Since these lasers predominantly fail by catastrophic and sudden degradation due to catastrophic optical damage (COD), it is especially crucial for space satellite applications to investigate reliability, failure modes, precursor signatures of failure, and degradation mechanisms of these lasers. Our group reported a new failure mode in MM and SM InGaAs-AlGaAs strained QW lasers in 2009 and 2016, respectively. Our group also reported in 2017 that bulk failure due to catastrophic optical bulk damage (COBD) is the dominant failure mode of both SM and MM lasers that were subject to long-term life-tests. For the present study, we continued our physics of failure investigation by performing long-term life-tests followed by failure mode analysis (FMA) using nondestructive and destructive micro-analytical techniques. We performed long-term accelerated life-tests on state-of-the-art SM and MM InGaAs- AlGaAs strained QW lasers under ACC mode. Our life-tests have accumulated over 25,000 test hours for SM lasers and over 35,000 test hours for MM lasers. We first employed electron beam induced current (EBIC) technique to identify failure modes of degraded SM lasers by observing dark line defects. All the SM failures that we studied showed catastrophic and sudden degradation and all of these failures were bulk failures. Since degradation mechanisms responsible for COBD are still not well understood, we also employed other techniques including focused ion beam (FIB) and high-resolution TEM to further study dark line defects and dislocations in post-aged lasers. Keywor

Paper Details

Date Published: 6 March 2018
PDF: 11 pages
Proc. SPIE 10514, High-Power Diode Laser Technology XVI, 1051414 (6 March 2018); doi: 10.1117/12.2286776
Show Author Affiliations
Yongkun Sin, The Aerospace Corp. (United States)
Talin Ayvazian, The Aerospace Corp. (United States)
Miles Brodie, The Aerospace Corp. (United States)
Zachary Lingley, The Aerospace Corp. (United States)


Published in SPIE Proceedings Vol. 10514:
High-Power Diode Laser Technology XVI
Mark S. Zediker, Editor(s)

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