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Analysis of periodically patterned metallic nanostructures for infrared absorber
Author(s): Sha Peng; Ying Yuan; Huabao Long; Runhan Liu; Dong Wei; Xinyu Zhang; Haiwei Wang; Changsheng Xie
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Paper Abstract

With rapid advancement of infrared detecting technology in both military and civil domains, the photo-electronic performances of near-infrared detectors have been widely concerned. Currently, near-infrared detectors demonstrate some problems such as low sensitivity, low detectivity, and relatively small array scale. The current studies show that surface plasmons (SPs) stimulated over the surface of metallic nanostructures by incident light can be used to break the diffraction limit and thus concentrate light into sub-wavelength scale, so as to indicate a method to develop a new type of infrared absorber or detector with very large array. In this paper, we present the design and characterization of periodically patterned metallic nanostructures that combine nanometer thickness aluminum film with silicon wafer. Numerical computations show that there are some valleys caused by surface plasmons in the reflection spectrum in the infrared region, and both red shift and blue shift of the reflection spectrum were observed through changing the nanostructural parameters such as angle α and diameters D. Moreover, the strong E-field intensity is located at the sharp corner of the nano-structures.

Paper Details

Date Published: 19 February 2018
PDF: 5 pages
Proc. SPIE 10607, MIPPR 2017: Multispectral Image Acquisition, Processing, and Analysis, 106070E (19 February 2018); doi: 10.1117/12.2286473
Show Author Affiliations
Sha Peng, Huazhong Univ. of Science and Technology (China)
Ying Yuan, Huazhong Univ. of Science and Technology (China)
Huabao Long, Shanghai Aerospace Control Technology Institute (China)
Runhan Liu, Huazhong Univ. of Science and Technology (China)
Dong Wei, Huazhong Univ. of Science and Technology (China)
Xinyu Zhang, Huazhong Univ. of Science and Technology (China)
Haiwei Wang, Huazhong Univ. of Science and Technology (China)
Changsheng Xie, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 10607:
MIPPR 2017: Multispectral Image Acquisition, Processing, and Analysis
Xinyu Zhang; Jun Zhang; Hongshi Sang, Editor(s)

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