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Nano-focusing effect simulation of metal film with subwavelength pattern structures
Author(s): Dong Wei; Yue Yu; Dapeng Li; Yong Wu; Zhaowei Xin; Xingwang Xie; Xinyu Zhang; Haiwei Wang; Changsheng Xie
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Paper Abstract

Surface plasmon polarizations (SPP) is a nano-scale photon control technology which can converge the spread of oscillation electron driven by incident light. In recent years, SPP has become an advanced research hotspot and has been studied more and more widely. The convergence effect of SPP has extensive applications, such as Schottky barrier detector in which the higher power hotspot, the lower signal-to-noise ratio. In this paper, studies have been done about the interaction of light and matter. Different geometric shapes have been simulated, which were obtained by graphic clipping. Via comparing the power of the hot spot and the minimum location on the transmittance line, we concluded the relationship of the interaction and the structure. It’s found that every absorption peak corresponds a mode of LSPP spread. Therefore, we can design figure to control the spread of the SPP, and achieve fantastic goal. Finally, a typical figure with high power hotspot was given.

Paper Details

Date Published: 19 February 2018
PDF: 5 pages
Proc. SPIE 10607, MIPPR 2017: Multispectral Image Acquisition, Processing, and Analysis, 106070B (19 February 2018); doi: 10.1117/12.2286447
Show Author Affiliations
Dong Wei, Huazhong Univ. of Science and Technology (China)
Yue Yu, Huazhong Univ. of Science and Technology (China)
Dapeng Li, Shanghai Aerospace Control Technology Institute (China)
Yong Wu, Huazhong Univ. of Science and Technology (China)
Zhaowei Xin, Huazhong Univ. of Science and Technology (China)
Xingwang Xie, Huazhong Univ. of Science and Technology (China)
Xinyu Zhang, Huazhong Univ. of Science and Technology (China)
Haiwei Wang, Huazhong Univ. of Science and Technology (China)
Changsheng Xie, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 10607:
MIPPR 2017: Multispectral Image Acquisition, Processing, and Analysis
Xinyu Zhang; Jun Zhang; Hongshi Sang, Editor(s)

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