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Proceedings Paper

Optoelectronic measurement system for testing the optical parameters of infrared seeker
Author(s): Wenjun He; Zhiying Liu; Yuegang Fu
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Paper Abstract

We propose an optoelectronic measurement system for testing the optical parameters of infrared seeker, such as the position of the image plane, the size of the diffused spot, and the diameter of the scanning circle. The measurement method and operating principle of the optoelectronic measurement system have been introduced. The source of the stray light in the optoelectronic measurement system have been analyzed by using FRED software, and the stray light have been restricted effectively by a co-centered mica plate which closes to the substrate of pinhole. Experimental results show that the test error for the size of the diffused spot is less than ±0.01 mm, the test errors for the position of the image plane and the diameter of the scanning circle are less than ±0.02 mm.

Paper Details

Date Published: 12 January 2018
PDF: 7 pages
Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 106210T (12 January 2018); doi: 10.1117/12.2286217
Show Author Affiliations
Wenjun He, Changchun Univ. of Science and Technology (China)
Zhiying Liu, Changchun Univ. of Science and Technology (China)
Yuegang Fu, Changchun Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 10621:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Liquan Dong, Editor(s)

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