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Proceedings Paper

Polarized BRDF measurement of the type E235B low carbon structural steel
Author(s): Yanlei Liu; Kun Yu; Kaihua Zhang; Yufang Liu
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Proc. SPIE OIT600, International Conference on Optical Instruments and Technology 2017: Optoelectronic Measurement Technology and System, ; doi: 10.1117/12.2286212
Show Author Affiliations
Yanlei Liu, Beijing Institue of Technology (China)
Henan Normal University (China)
Kun Yu, Henan Normal University (China)
Kaihua Zhang, Beijing Institute of Technology (China)
Yufang Liu, Henan Normal University (China)


Published in SPIE Proceedings Vol. OIT600:
International Conference on Optical Instruments and Technology 2017: Optoelectronic Measurement Technology and System
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Liquan Dong, Editor(s)

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