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Focus classification in digital holographic microscopy using deep convolutional neural networks
Author(s): Tomi Pitkäaho; Aki Manninen; Thomas J. Naughton
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Paper Abstract

In digital holographic microscopy, one often obtains an in-focus image of the sample by applying a focus metric to a stack of numerical reconstructions. We present an alternative approach using a deep convolutional neural network.

Paper Details

Date Published: 28 July 2017
PDF: 3 pages
Proc. SPIE 10414, Advances in Microscopic Imaging, 104140K (28 July 2017); doi: 10.1117/12.2286161
Show Author Affiliations
Tomi Pitkäaho, National Univ. of Ireland, Maynooth (Ireland)
Aki Manninen, Univ. of Oulu (Finland)
Thomas J. Naughton, National Univ. of Ireland, Maynooth (Ireland)


Published in SPIE Proceedings Vol. 10414:
Advances in Microscopic Imaging
Emmanuel Beaurepaire; Francesco Saverio Pavone; Peter T. C. So, Editor(s)

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