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Proceedings Paper

Backscattered light properties during femtosecond laser ablation and development of a dynamic interferometric focusing system
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Paper Abstract

The backscattered light originated when machining with femtosecond laser pulses can be used to accurately measure the processed surface position through an interferometer, as recently demonstrated by our group, in a setup that uses the same laser beam for ablation and inspection. The present work explores the characteristics of the laser light reflected by the target and its interaction with the resulting plasma to better understand its propagation physics and to improve the dynamic focusing system. The origin of this returning radiation was studied and has been traced, mainly, from the peripheral area of the focal spot (doughnut-like). By means of a Mach-Zehnder setup, the interferometric pattern was measured and analyzed aiming to access the influences of the plasma on the laser beam properties, and therefore on the retrieved information. Finally, the wavefront of the laser that creates and propagates through the plasma was characterized using a Shack-Hartmann sensor.

Paper Details

Date Published: 15 February 2018
PDF: 9 pages
Proc. SPIE 10525, High-Power Laser Materials Processing: Applications, Diagnostics, and Systems VII, 105250H (15 February 2018); doi: 10.1117/12.2285899
Show Author Affiliations
Marcus Paulo Raele, Instituto de Pesquisas Energéticas e Nucleares (Brazil)
Ricardo Elgul Samad, Instituto de Pesquisas Energéticas e Nucleares (Brazil)
Anderson Zanardi Freitas, Instituto de Pesquisas Energéticas e Nucleares (Brazil)
Lucas De Pretto, Instituto de Pesquisas Energéticas e Nucleares (Brazil)
Marcello Magri Amaral, Univ. Brasil (Brazil)
Nilson Dias Vieira, Instituto de Pesquisas Energéticas e Nucleares (Brazil)
Niklaus U. Wetter, Instituto de Pesquisas Energéticas e Nucleares (Brazil)


Published in SPIE Proceedings Vol. 10525:
High-Power Laser Materials Processing: Applications, Diagnostics, and Systems VII
Stefan Kaierle; Stefan W. Heinemann, Editor(s)

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