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Proceedings Paper

Gas identification field test based on FTIR imaging spectrometer
Author(s): Chensheng Wang; Xingchao Liu; Zhijie Zhang; Hui Yu
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Paper Abstract

Gas detection and identification is based on the spectral absorption peak feature, which is acquired by the spectrometer. FTIR imaging spectrometer has the advantages of high spectral resolution and good sensitivity, which are both suitable for the unknown or mixture gas identification applications, such as plume pollution monitoring, chemical agents detection and leakage detection. According to the application requirement, a dual band FTIR imaging spectrometer has been developed and verified. This FTIR imaging spectrometer combines the infrared thermal imaging sensor and Michelson interferometer to form the three dimensional data cube. Based on this instrument, the theoretical analysis and algorithm is introduced, and the numerical method is explained to illuminate the basic idea in gas identification based on spectral features. After that, the field verification test is setup and completed. Firstly, the FTIR imaging spectrometer is used to detect SF6, NH3 and the mixture gas, while the gas is exhausted out from the storage vase with a specific speed. Secondly, the instrument is delivered to the industrial area to monitor the plume emission, and analyze the components in plume. Finally, the instrument is utilized to monitoring the oil spill in ocean, and the practical maritime trial is realized. Further, the gas concentration evaluation method is discussed. Quantitative issue in gas identification is an important topic. The test results show that, based on the gas identification method introduced in this paper, FTIR imaging spectrometer can be utilized to identify the unknown gas or mixture gas in real time. The instrument will play a key role in environmental emergency and monitoring application.

Paper Details

Date Published: 24 October 2017
PDF: 10 pages
Proc. SPIE 10461, AOPC 2017: Optical Spectroscopy and Imaging, 104611S (24 October 2017); doi: 10.1117/12.2285838
Show Author Affiliations
Chensheng Wang, Huazhong Institute of Electro-Optics (China)
Xingchao Liu, Huazhong Institute of Electro-Optics (China)
Zhijie Zhang, Huazhong Institute of Electro-Optics (China)
Hui Yu, Huazhong Institute of Electro-Optics (China)


Published in SPIE Proceedings Vol. 10461:
AOPC 2017: Optical Spectroscopy and Imaging
Jin Yu; Zhe Wang; Wei Hang; Bing Zhao; Xiandeng Hou; Mengxia Xie; Tsutomu Shimura, Editor(s)

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